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PH62501---Electron Microscopy

This is a hands-on course intended to provide the necessary theory in the methods of transmission electron microscopy, scanning electron microscopy, and x-ray diffraction. In addition, the principles of scanning tunneling electron microscopy (STM) and atomic force microscopy (AFM) will be reviewed.

<>Textbook:
D.B. Williams and C.B. Carter, Transmission Electron Microscopy, Prenum Press, New York, 1996.

Referencs:
* J.W. Edington Electron Microscopy in Materials Science, The MACMILLAN PRESS LTD, London and Basingstoke, 1974.
* P.B. Hirsch, A.Howie, R.B. Nicholson, and D.W. Pashley, Electron Microscopy of Thin Crystals, Butterworths, London, 1965.

PH53501---Experiments in Physics

This is a hands-on training intended to provide the necessary individual practical training in the methods of transmission electron microscopy, instrumental techniques and interpretative application of contrast and diffraction principles, to enable students to apply this method of structural characterization to problems connected with their research projects. Small group laboratory session are given to make the students confident with operation of the instrument. A series of exercises are carried out by each student to afford practice in the various capabilities of the TEM method. The students should be able to  operate the microscope independently after this training course.
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