PH625, 985---Electron Microscopy (Fall Semester)


Instructor
Jianyu Huang, Research Assistant Professor of Department of Physics

Textbook:
D.B. Williams and C.B. Carter, Transmission Electron Microscopy, Prenum Press, New York, 1996.

Referencs:
* J.W. Edington Electron Microscopy in Materials Science, The MACMILLAN PRESS LTD, London and Basingstoke, 1974.
* P.B. Hirsch, A.Howie, R.B. Nicholson, and D.W. Pashley, Electron Microscopy of Thin Crystals, Butterworths, London, 1965.

Goals
This is a hands-on course intended to provide the necessary theory in the methods of transmission electron microscopy, scanning electron microscopy, and x-ray diffraction. In addition, the principles of scanning tunneling electron microscopy (STM) and atomic force microscopy (AFM) will be reviewed.

Grade
* Attendance of class
* Assignment
* Final Examination

Course Topics (class hours)
1. Basics of electron microscopy
* Introduction to TEM
* Scattering and diffraction
* Elastic scattering
* Inelastic scattering and beam damage
* Electron sources
* Optics
* Lenses, apertures and resolution
* The instrument and electron optics
* Specimen preparation

2. Diffraction
* Diffraction patterns
* Reciprocal space
* Diffraction from crystals
* Diffraction from small volumes
* Stereograms, planar and directional for general symmetry
* Indexing diffraction patterns, the general method
* Kikuchi diffraction
* Obtaining CBED patterns
* Using convergent beam techniques

3. Imaging
* Imaging in the TEM
* Thickness and bending effects
* Dark field and weak beam techniques

4. Microchemical analysis by energy dispersive spectroscopy
* X-ray spectrometry
* The EDS- TEM interface
* Qualitative X -ray analysis

5. Microchemical analysis by electron energy loss spectroscopy
* Zero-loss peak
* Low-loss spectrum
* Core-loss spectrum

6. Fundamental Scanning Electron Microscopy

7. Fundamental x-ray Diffraction

8. Scanning Tunneling Electron Microscopy

9. Atomic Force Microscopy