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This instrument is an advanced and digitally dedicated transmission
electron microscope operating at 200kV with a field-emission gun. It is
capable of an ultimate point-to-point resolution of 0.19 nm, with the ability
to image lattice fringes at 0.14 nm resolution. It is a multipupose ultrahigh
resolution analytical electron microscope with a wide range of capabilities
such as high resolution image observation, nanoarea X-ray analysis, versatile
analysis by convergent-beam electron diffraction, and analysis of the atomic
structure and/or bonding state of atoms. With the addition of Energy dispersive
X-ray spectrometer (EDS) and Parellel electron energy loss spectrometer
(PEELS), the field-emission TEM can also be used as an elemental analysis
tool, capable of identifying the elements in areas less than 2 nm in diameter.
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200 kV, Schottky Field Emission Gun
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Ultra High Resolution Pole Piece (Cs=0.5 mm)
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0.19 nm Point-to-Point Resolution
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Minimum Beam Size: 0.5 nm
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JEOL Single Tilt Low Backgraound Holder
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JEOL Double Tilt Low Background Holder
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Double Tilt Heating Holder (Maximum Temperature: 1000ºC)
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Specimen Tilt Angle (X axis): ±20º
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High Resolution Imaging
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Convergent Beam Electron Diffraction (CBED)
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Energy Dispersive X-Ray Analysis (EDS)
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Electron Energy Loss Spectroscopy (EELS)
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