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Facilities
Transmission Electron Microscopes
JEOL
2010F Transmission Electron Microscope
This instrument is an advanced and digitally dedicated transmission
electron microscope operating at 200kV with a field-emission gun. It is
capable of an ultimate point-to-point resolution of 0.19 nm, with the
ability to image lattice fringes at 0.14 nm resolution. It is a multipupose
ultrahigh resolution analytical electron microscope with a wide range
of capabilities such as high resolution image observation, nanoarea X-ray
analysis, versatile analysis by convergent-beam electron diffraction,
and analysis of the atomic structure and/or bonding state of atoms. With
the addition of Energy dispersive X-ray spectrometer (EDS) and Parellel
electron energy loss spectrometer (PEELS), the field-emission TEM can
also be used as an elemental analysis tool, capable of identifying the
elements in areas less than 2 nm in diameter.
200 kV, Schottky Field Emission Gun
Ultra High Resolution Pole Piece (Cs=0.5 mm)
0.19 nm Point-to-Point Resolution
Minimum Beam Size: 0.5 nm
JEOL Single Tilt Low Backgraound Holder
JEOL Double Tilt Low Background Holder
Double Tilt Heating Holder (Maximum Temperature: 1000ēC)
Specimen Tilt Angle (X axis): ±20ē
High Resolution Imaging
Convergent Beam Electron Diffraction (CBED)
Energy Dispersive X-Ray Analysis (EDS)
Electron Energy Loss Spectroscopy (EELS)
JEOL
200CX Transmission Electron Microscope
* 200 kV
* 0.25 nm Point-to-Point Resolution
* Good For General Diffraction Contrast Imaging, Large-Angle Tilting
(±60ē )
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Department news archive
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