Facilities

Transmission Electron Microscopes

JEOL 2010F Transmission Electron Microscope
• This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, with the ability to image lattice fringes at 0.14 nm resolution. It is a multipupose ultrahigh resolution analytical electron microscope with a wide range of capabilities such as high resolution image observation, nanoarea X-ray analysis, versatile analysis by convergent-beam electron diffraction, and analysis of the atomic structure and/or bonding state of atoms. With the addition of Energy dispersive X-ray spectrometer (EDS) and Parellel electron energy loss spectrometer (PEELS), the field-emission TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 2 nm in diameter. 
• 200 kV, Schottky Field Emission Gun
• Ultra High Resolution Pole Piece (Cs=0.5 mm)
• 0.19 nm Point-to-Point Resolution
• Minimum Beam Size: 0.5 nm
• JEOL Single Tilt Low Backgraound Holder
• JEOL Double Tilt Low Background Holder
• Double Tilt Heating Holder (Maximum Temperature: 1000ºC)
• Specimen Tilt Angle (X axis): ±20º
• High Resolution Imaging
• Convergent Beam Electron Diffraction (CBED)
• Energy Dispersive X-Ray Analysis (EDS)
• Electron Energy Loss Spectroscopy (EELS)

JEOL 200CX Transmission Electron Microscope
* 200 kV
* 0.25 nm Point-to-Point Resolution
* Good For General Diffraction Contrast Imaging,  Large-Angle Tilting (±60º )