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JEOL 6340F Scanning Electron Microscope

• This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples. 
• Resolution: 1.2nm
• Accelerating Voltage: 0.5-20keV
• Stage: X=50mm; Y=70mm, Z=25mm
• Tilt Angle: -5º to +45º
• Rotation: 360º Endless
• Energy Dispersive X-ray Spectrometer (EDS)



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140 Commonwealth Ave, Chestnut Hill, MA 02467
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Prof. Padilla lab reports on metamaterials' properties with promising new applications
MORE | BC News Release>>
 
 

The Department of Physics acknowledges its AY 07-08 award winners
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Professor George Goldsmith celebrates 85th birthday
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The Department of Physics makes successful contribution to scientific agenda of 2008 March Meeting
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Nanotech fuels thermoelectric breakthrough
BC INFO | Science | APS-DCMP News | Boston Globe | MORE>>
 
 

Prof. Kalman's paper recently appeared in Phys. Rev. Letters
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Department news archive
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