Facilities

JEOL 6340F Scanning Electron Microscope

• This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer. This instrument is also equipped with an energy dispersive X-ray spectrometer (EDS), smart X-ray element mapping can be carried out. In the low-voltage mode it is capable of imaging a wide variety of uncoated insulating samples. 
• Resolution: 1.2nm
• Accelerating Voltage: 0.5-20keV
• Stage: X=50mm; Y=70mm, Z=25mm
• Tilt Angle: -5º to +45º
• Rotation: 360º Endless
• Energy Dispersive X-ray Spectrometer (EDS)